Effective Yield Analysis achieves accurate yield prediction and ensures the right level of work in progress (WIP). Following is a brief story board of some of the ways in which the PV-WAVE Family can provide the right analysis framework to increase yield predictability, ensure a quick response time to yield problems, monitor process tool performance, improve maintenance schedules, and reduce die loss.

The PV-WAVE family, which includes our industry standard IMSL libraries, combined with our consulting expertise provides the ability to quickly, consistently, and flexibly analyze and visualize specialized data from your wafer manufacturing process will significantly increase your return on investment (ROI).

Lot Quality Control
An important aspect of yield analysis is the statistical analysis of yield parameters. A simple, intuitive interface tailored to your unique requirements allows your analysts to focus on critical yield management improvements and not spend valuable time on how to run applications or get the data.

View the Lot Quality Control Example >>

Wafer Map
Looking at wafer maps is another technique for finding yield problems and understanding defect patterns. With wafer maps, your analysts can drill down to individual wafer to look at specific failures or look at composite maps to identify meaningful trends and insights that can significantly improve the operational efficiencies of the wafer manufacturing process.